Device programming and related boundary-scan test technologies were the focus of several exhibits at Assembly Technology Expo (September 27-29, 2005, Rosemont, IL, Assembly Magazine www.atexpo.com), ...
A new concept can execute the same boundary scan test pattern on various ATE systems without modification. Boundary scan is well established and widely used for various board- and system-level test ...
NASHUA, NH – Flynn Systems Corporation announces the release of its USB Dual Channel 30MHz HighSpeed Test and Programming Cable for Boundary Scan applications. The HighSpeed Cable is the newest tool ...
Richardson, TX. ASSET InterTech announced it is offering test and programming tools that will accelerate development and production cycles for designs based on Xilinx Zynq-7000 SoCs. These new tools, ...
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