Regardless of the test methodology employed, the goal of manufacturing test is to identify, or screen out, defective devices before they are embedded into a system or shipped to the end customer. More ...
Memory-efficient, multithreaded engines utilize available server cores to speed up automatic test pattern generation (ATPG) and silicon diagnosis Twenty-five percent fewer test patterns reduce test ...
TetraMAX II ATPG reduced test generation runtime by an order of magnitude, from an overnight run to less than one hour, while producing 50 percent fewer patterns DecaWave met their silicon test time ...
Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...
Today’s highly complex and large system on chip (SoC) devices and systems present many challenges to be addressed from manufacturing tests to the field while meeting stringent requirements for test ...
Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...
The complexity of system-on-chip (SoC) designs continues to grow, so the corresponding design-for-test (DFT) logic required for manufacturing has become more advanced. Design teams are challenged by ...
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